Covalent Metrology Installs New CFEG TEM Equipped for High-Resolution EELS and EFTEM
SUNNYVALE, Calif., June 21, 2022 /PRNewswire/ -- Covalent Metrology, a leading North-American analytical services provider, announced today that it has significantly expanded its capacity and capabilities for (Scanning) Transmission Electron Microscopy (S/TEM). The JEM-F200 S/TEM from JEOL, a leading manufacturer of analytical instruments based in Japan, streamlines analysis and permits more flexible sample types, including beam-sensitive and magnetic materials. Clients working with semiconductors, batteries, nanomaterials, and more will benefit from atomic-scale imaging and EDS mapping, along with new energy-filtered TEM (EFTEM) and high-resolution EELS services that can help to design, optimize, and accelerate manufacturing processes.
- Covalent completes installation of a new, cutting-edge JEOL JEM-F200 microscope with a cold-field-emission gun (CFEG) source and a Gatan Imaging Filter for EELS and EFTEM.
- Clients working with semiconductors, batteries, nanomaterials, and more will benefit from atomic-scale imaging and EDS mapping, along with new energy-filtered TEM (EFTEM) and high-resolution EELS services that can help to design, optimize, and accelerate manufacturing processes.
- The narrow energy spread additionally facilitates high energy resolution (0.3 eV) for EELS and EFTEM on the equipped Gatan GIF Continuum ER system.
- EFTEM provides significant benefits for analyzing light-element materials, allowing Covalent to address many common challenges in battery and memory devices.