Energy-dispersive X-ray spectroscopy

VTT's multi-million investment in a plasma-FIB scanning electron microscope catapults Finland to the forefront of Nordic materials research

Retrieved on: 
Tuesday, March 26, 2024
Failure, TESCAN, Xe, Map, Research, EDS, Metal, 3D, Energy-dispersive X-ray spectroscopy, Wood, ICME, VTT, Ceramic, Paper, EBSD, Gallium, FIB, Microscope

ESPOO, Finland, March 26, 2024 /PRNewswire/ -- The first plasma-FIB scanning electron microscope in Finland has just become operational at VTT in Espoo, Finland.

Key Points: 
  • ESPOO, Finland, March 26, 2024 /PRNewswire/ -- The first plasma-FIB scanning electron microscope in Finland has just become operational at VTT in Espoo, Finland.
  • A TESCAN AMBER X system, Finland's first Focused Ion Beam (FIB) Scanning Electron Microscope (SEM) using Xenon plasma, has been taken into use at VTT Technical Research Centre of Finland.
  • Compared to traditional FIB-SEMs, it provides huge potential for excelling in materials research and multiplying the speed of materials development.
  • "The new capability for lightning-fast materials characterization in 3D supports, for example, integrated computational materials engineering (ICME) and materials acceleration platforms (MAPs).

Covalent Metrology Installs New CFEG TEM Equipped for High-Resolution EELS and EFTEM

Retrieved on: 
Tuesday, June 21, 2022
Solution, SEM, EELS, TEMS, EDS, Historic Environment Scotland, Semiconductor, Silicon, Research, SEMS, EFTEM, CFEG, Education, Communities and Justice Directorates, S/TEM, ESR meter, JEOL, Partnership, TEM, Metrology, Energy-dispersive X-ray spectroscopy, Multimedia, Collection, Microscope, Ceramic, Covalent bond

SUNNYVALE, Calif., June 21, 2022 /PRNewswire/ -- Covalent Metrology, a leading North-American analytical services provider, announced today that it has significantly expanded its capacity and capabilities for (Scanning) Transmission Electron Microscopy (S/TEM). The JEM-F200 S/TEM from JEOL, a leading manufacturer of analytical instruments based in Japan, streamlines analysis and permits more flexible sample types, including beam-sensitive and magnetic materials. Clients working with semiconductors, batteries, nanomaterials, and more will benefit from atomic-scale imaging and EDS mapping, along with new energy-filtered TEM (EFTEM) and high-resolution EELS services that can help to design, optimize, and accelerate manufacturing processes.

Key Points: 
  • Covalent completes installation of a new, cutting-edge JEOL JEM-F200 microscope with a cold-field-emission gun (CFEG) source and a Gatan Imaging Filter for EELS and EFTEM.
  • Clients working with semiconductors, batteries, nanomaterials, and more will benefit from atomic-scale imaging and EDS mapping, along with new energy-filtered TEM (EFTEM) and high-resolution EELS services that can help to design, optimize, and accelerate manufacturing processes.
  • The narrow energy spread additionally facilitates high energy resolution (0.3 eV) for EELS and EFTEM on the equipped Gatan GIF Continuum ER system.
  • EFTEM provides significant benefits for analyzing light-element materials, allowing Covalent to address many common challenges in battery and memory devices.

Covalent Metrology Expands its Electron Microscopy Capabilities

Retrieved on: 
Thursday, April 14, 2022
Covalent bond, Electron backscatter diffraction, S/TEM, Orientation, EBSD, Electronics, Chemistry, Energy-dispersive X-ray spectroscopy, 3D, Silicon, EDS, Microscope, Scio Diamond Technology Corporation

SUNNYVALE, Calif., April 14, 2022 /PRNewswire/ -- Covalent Metrology, a leading provider of analytical services in North America, announces the installation of two new Thermo Fisher Scientific Helios 5 UC DualBeam focused-ion-beam scanning electron microscopes (FIB-SEMs). Covalent now has four (4) Helios 5 microscopes, which is believed to be the most extensive fleet of new DualBeams among any service labs in North America.  The company's instrument acquisitions parallel growth in its electron microscopy teams: joined by four new technical staff in the last quarter. With expanded tool and team capacity, Covalent can meet the growing demand for electron microscopy services in the Silicon Valley area and beyond. Clients developing nanomaterials, semiconductor devices, electronics, and medical technologies will all benefit from faster access to nanoscale-resolution imaging.

Key Points: 
  • The Growing Electron Microscopy Group at Covalent's Silicon Valley lab significantly expands its team and instrument portfolio for FIB-SEM and S/TEM analysis.
  • The company's instrument acquisitions parallel growth in its electron microscopy teams: joined by four new technical staff in the last quarter.
  • With expanded tool and team capacity, Covalent can meet the growing demand for electron microscopy services in the Silicon Valley area and beyond.
  • Covalent has extended both its capacity and capabilities to deliver the latest, cutting-edge microscopy solutions to a growing market."

Global X-Ray Detector Market (2020 to 2027) - by Type and Application - ResearchAndMarkets.com

Retrieved on: 
Monday, December 21, 2020
Medical devices, Health, Radiation, Radiography, Electromagnetic radiation, Medical imaging, X-rays, Detectors, X-ray detector, Digital radiography, Semiconductor detector, Energy-dispersive X-ray spectroscopy

The "X-Ray Detector Market by Type and Application: Global Opportunity Analysis and Industry Forecast, 2020-2027" report has been added to ResearchAndMarkets.com's offering.

Key Points: 
  • The "X-Ray Detector Market by Type and Application: Global Opportunity Analysis and Industry Forecast, 2020-2027" report has been added to ResearchAndMarkets.com's offering.
  • Major factors that affects the growth of the global X-ray detector market are The rise in demand for digital imaging technologies, advantages of digital X-ray detectors, and favorable reimbursement policies for X-rays drive growth of the global X-ray detector market.
  • The global X-ray detector market is segmented into type, application, and region.
  • A comprehensive analysis of the factors that drive and restrain the growth of the global X-ray detector market is provided.

Thermo Scientific Axia ChemiSEM Increases Data Acquisition Speed, Simplicity for Materials Micro-Analysis

Retrieved on: 
Tuesday, November 10, 2020
Scientific method, Science and technology, Science, X-rays, Electron microscopy, Microscopes, Measuring instruments, Scanning electron microscope, Electron microscope, Energy-dispersive X-ray spectroscopy, Thermo Fisher Scientific

HILLSBORO, Ore., Nov. 10, 2020 /PRNewswire/ --Thermo Fisher Scientifictoday unveiled the Thermo Scientific Axia ChemiSEM, a cost-effective, floor-model scanning electron microscope (SEM) that takes materials micro-structural analysis and defect discovery to a new level of speed and simplicity.

Key Points: 
  • HILLSBORO, Ore., Nov. 10, 2020 /PRNewswire/ --Thermo Fisher Scientifictoday unveiled the Thermo Scientific Axia ChemiSEM, a cost-effective, floor-model scanning electron microscope (SEM) that takes materials micro-structural analysis and defect discovery to a new level of speed and simplicity.
  • Axia ChemiSEM includes always-on energy dispersive spectroscopy (EDS) analysis with Thermo Fisher's breakthrough ChemiSEM technology, providing academic and industrial users with near instant access to quantitative compositional imaging.
  • The result of this instant access: Axia ChemiSEM provides actionable data up to twice as fast as other competing SEM-EDS solutions currently on the market.
  • "The Axia ChemiSEM is a single platform that has always-on EDS data.

New Application Report from Rigaku Examines Use of EDXRF for Industrial Forensics

Retrieved on: 
Tuesday, August 11, 2020
X-ray spectroscopy, Physical sciences, Radiation, Rigaku, Natural sciences, Measuring instruments, X-rays, Industrial forensics, X-ray fluorescence, Energy-dispersive X-ray spectroscopy, edX, Agilent Technologies

AUSTIN, Texas, Aug. 11, 2020 /PRNewswire-PRWeb/ --Applied Rigaku Technologies, Inc. ( ART ) has published an application report describing the use of Energy Dispersive X-ray Fluorescence ( EDXRF ) for industrial forensics in the investigation of unknown sample materials.

Key Points: 
  • AUSTIN, Texas, Aug. 11, 2020 /PRNewswire-PRWeb/ --Applied Rigaku Technologies, Inc. ( ART ) has published an application report describing the use of Energy Dispersive X-ray Fluorescence ( EDXRF ) for industrial forensics in the investigation of unknown sample materials.
  • Rigaku EDXRF Application Note #2000, available on the company's website, includes information about sample preparation, material characterization and spectral analysis.
  • Industrial forensics employs an analytical response to potential problems encountered at different stages in the industrial manufacturing process, examining each step in the product life cycle to identify, prevent and resolve manufacturing issues.
  • Throughout the world, Rigaku continuously promotes partnerships, dialog, and innovation within the global scientific and industrial communities.

Rigaku Publishes EDXRF Method for Analysis of Carbon Black

Retrieved on: 
Monday, April 27, 2020
Physical sciences, Chemistry, Natural sciences, X-ray spectroscopy, Rigaku, Measuring instruments, X-rays, Analytical chemistry, Energy-dispersive X-ray spectroscopy, Molecular physics, X-ray fluorescence, Elemental analysis

AUSTIN, Texas, April 27, 2020 /PRNewswire-PRWeb/ --Applied Rigaku Technologies, Inc. ( ART ) has published an application report describing the analysis of carbon black by Energy Dispersive X-ray Fluorescence ( EDXRF ).

Key Points: 
  • AUSTIN, Texas, April 27, 2020 /PRNewswire-PRWeb/ --Applied Rigaku Technologies, Inc. ( ART ) has published an application report describing the analysis of carbon black by Energy Dispersive X-ray Fluorescence ( EDXRF ).
  • The elemental characterization of carbon black is critical in ensuring proper quality of the contingent products.
  • The method presented in Rigaku Application Note #1846 describes the elemental analysis of carbon black and demonstrates the performance of the Rigkau NEX DE EDXRF analyzer.
  • Throughout the world, Rigaku continuously promotes partnerships, dialog, and innovation within the global scientific and industrial communities.

Rigaku Presents Latest Analytical Instruments at Pittcon Conference and Expo

Retrieved on: 
Monday, March 2, 2020
Measuring instruments, X-ray spectroscopy, Physical sciences, Scientific method, Rigaku, Chemistry, Miniflex, Diffractometer, X-ray fluorescence, Energy-dispersive X-ray spectroscopy, Spectrometer, SPECTRO Analytical Instruments

Pittcon is the world's leading annual conference and exposition on laboratory science, attracting attendees from industry, academia and government from over 90 countries worldwide.

Key Points: 
  • Pittcon is the world's leading annual conference and exposition on laboratory science, attracting attendees from industry, academia and government from over 90 countries worldwide.
  • Rigaku (The Woodlands, TX) is showing the Rigaku MiniFlex benchtop X-ray diffractometer, and the Rigaku Supermini200 benchtop wavelength dispersive X-ray fluorescence ( WDXRF ) spectrometer.
  • Applied Rigaku Technologies, Inc. (ART, Austin, TX) is presenting the Rigaku NEX QC series of low-cost benchtop EDXRF spectrometers.
  • Handheld and portable spectrometers from Rigaku Analytical Devices (RAD, Wilmington, MA) are also displayed at the Rigaku booth.

Applied Rigaku Technologies Presents Latest EDXRF Solutions for Petroleum and Petrochem at the 2019 Gulf Coast Conference

Retrieved on: 
Monday, October 14, 2019
Measuring instruments, Rigaku, Spectroscopy, Energy-dispersive X-ray spectroscopy, SPECTRO Analytical Instruments, Scientific method, Science

Among the elemental analysis tools on display will be the Rigaku NEX DE premium high-performance benchtop direct excitation EDXRF elemental analyzer and the Rigaku NEX QC+ high-resolution benchtop EDXRF spectrometer.

Key Points: 
  • Among the elemental analysis tools on display will be the Rigaku NEX DE premium high-performance benchtop direct excitation EDXRF elemental analyzer and the Rigaku NEX QC+ high-resolution benchtop EDXRF spectrometer.
  • The system operates on the latest Rigaku QuantEZ analytical software, specifically designed for the Rigaku family of benchtop EDXRF analyzers.
  • Other X-ray analytical instrumentation available from Rigaku include the Rigaku NEX CG advanced Cartesian geometry EDXRF spectrometer.
  • More information about EDXRF / XRF analytical solutions from Applied Rigaku Technologies, Inc. for the petroleum and petrochemical industries is available at booth #102 and at http://www.rigakuedxrf.com/petroleum .

Rigaku Publishes Method for Measurement of Chromium on HDG Steel

Retrieved on: 
Thursday, August 15, 2019
Chemistry, Physical sciences, Chemical elements, Corrosion prevention, Coatings, Zinc, Metal plating, Occupational safety and health, Galvanization, Hot-dip galvanization, Energy-dispersive X-ray spectroscopy, Chromium

Applied Rigaku Technologies, Inc. has published a new application report that describes the measurement of chromium conversion coating on hot-dip galvanized steel by Energy Dispersive X-ray Fluorescence ( EDXRF ).

Key Points: 
  • Applied Rigaku Technologies, Inc. has published a new application report that describes the measurement of chromium conversion coating on hot-dip galvanized steel by Energy Dispersive X-ray Fluorescence ( EDXRF ).
  • Steel for the automotive industry is typically first galvanized with a zinc coating before the conversion coating is applied.
  • Coated steel is used for outdoor structures and similar uses where steel is exposed to weathering.
  • The results shown illustrate that the NEX QC+ analyzer provides excellent sensitivity and performance for the measurement of chromium conversion coatings on HDG steel.