Silicon Valley Microelectronics

Aehr Receives $10.8 Million Order for Production Test and Burn-in of Silicon Carbide Power Semiconductors for Electric Vehicles

Retrieved on: 
Monday, July 19, 2021
Materials, Semiconductor device fabrication, Matter, Chemistry, Wafer, Silicon carbide, Silicon Valley Microelectronics

Our solution can not only test 100mm and 150mm diameter silicon carbide wafers, but can test the future 200mm wafers planned to be introduced over the next several years.

Key Points: 
  • Our solution can not only test 100mm and 150mm diameter silicon carbide wafers, but can test the future 200mm wafers planned to be introduced over the next several years.
  • Aehr provides a unique fully integrated solution that includes the test systems, full wafer WaferPak Contactors, and WaferPak Aligners.
  • Silicon carbide power semiconductors have emerged as the preferred technology for battery electric vehicle power conversion in on-board and off-board electric vehicle battery chargers, and the electric power conversion and control of the electric engines.
  • These stats highlight the tremendous opportunity Aehr Test has in front of it with its wafer level test and burn-in solution for electric vehicle semiconductors.

Aehr Receives Over $2.3 Million Follow-on Order for FOX-XP™ System for High Volume Wafer Level Production Test and Burn-In of Silicon Carbide Devices

Retrieved on: 
Tuesday, June 1, 2021
Materials, Semiconductor device fabrication, Chemistry, Physical sciences, Wafer, Semiconductor device, Silicon carbide, Silicon, Reliability, Silicon Valley Microelectronics

FREMONT, Calif., June 01, 2021 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has received and shipped a follow-on order totaling more than $2.3 million from its lead silicon carbide customer for a FOX-XP Wafer Level Test and Burn-in system for high volume production test and burn-in of the customers line of silicon carbide devices.

Key Points: 
  • FREMONT, Calif., June 01, 2021 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has received and shipped a follow-on order totaling more than $2.3 million from its lead silicon carbide customer for a FOX-XP Wafer Level Test and Burn-in system for high volume production test and burn-in of the customers line of silicon carbide devices.
  • This customer is a leading Fortune 500 supplier of semiconductor devices with a significant customer base in the automotive semiconductor market, and is using Aehrs FOX-XP system for high volume production burn-in and infant mortality screening of silicon carbide devices at wafer level for electric vehicle power modules.
  • The FOX-XP system is configured to test eighteen silicon carbide wafers in parallel while contacting and testing 100% of the devices on each wafer.
  • Silicon carbide continues to be promising as a key growth driver for Aehr, and we anticipate that silicon carbide wafer level burn-in will become the industry standard for low cost and 100% traceability for burn-in and reliability screening.