Nanotronics announces the addition of nSpec™ PRISM at Semicon Japan
The company made the announcement at Semicon Japan, a premium international exhibition showcasing the latest in technological innovation across all stages of the electronics manufacturing supply chain.
Today Nanotronics, the factory control company, announced its latest photoluminescence system, nSpecTM PRISM. This addition to the Nanotronics product suite offers a complete solution for SiC frontend wafer manufacturing from unpolished SiC substrate to epitaxy and device manufacturing, eliminating the need for destructive testing methods such as KOH etching. The system specializes in pairing transmission and PL microscopy for high volume inspection of SiC killer defects such as micropipes and dislocations.
The company made the announcement at Semicon Japan, a premium international exhibition showcasing the latest in technological innovation across all stages of the electronics manufacturing supply chain.
Nanotronics, a vertically integrated manufacturer of automated optical inspection systems, is expanding its system portfolio through the introduction of the nSpecTM PRISM. The platform introduces a new illuminator which allows Nanotronics to deliver more power to the sample plane. The illuminator enables operators to utilize existing imaging modalities like brightfield, transmission, darkfield, and Nomarski DIC while adding UV and IR illumination to inspection processes.
“We are excited to introduce nSpecTM PRISM to our existing and expanding customer base worldwide. The custom illuminator is a crucial component of our modular design, allowing our customers to broaden their defect detection and classification capabilities directly on the factory floor,” says Director of Product, APAC, Jacob Keith. “Designing and manufacturing our illuminator this way also helps us reduce global supply chain pressures and maintain our efficient lead and support times.”
The nSpecTM PRISM system, when coupled with Nanotronics’ existing AI infrastructure, nTelligenceTM, allows customers to detect and classify stacking faults, triangles, and other defects of interest on SiC epitaxial wafers as well as cracks and sliplines in GaN.
**Nanotronics will provide onsite demonstrations at Semicon Japan from Wednesday, December 14th – Friday, December 16th, displaying the system at booth #5820, Aamilia Japan KK.**
About Nanotronics
Nanotronics is an advanced machines and intelligence company that helps customers across the public, private, and nonprofit sectors solve for the unique inspection and process control challenges of precision manufacturing.
A leading developer of optical inspection tools for the semiconductor industry, Nanotronics uses hardware and software to provide industrial-scale, high-throughput, super imaging systems. Deployed across fifteen countries and industry agnostic, Nanotronics works across Capital Intensive Industries, from aerospace, to electronics, to healthcare, to drive up yield, reduce footprint and waste, lower costs, and speed up design iteration, while eliminating laborious manual inspections.
To learn more visit https://nanotronics.co.
Contact [email protected] to learn how you can partner with Nanotronics to implement AIPC™ in your manufacturing facility.
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