Powerful AFM Offline Analysis Software Now Available for Oxford Instruments Asylum Research Jupiter XR Large-Sample Atomic Force Microscope
Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force microscope (AFM).
- Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force microscope (AFM).
- AR Maps provides roughness information based on ISO standards, generates statistics reports, conducts critical dimension and trench analysis, performs particle analysis, and much more.
- The new AR Maps software package will ship with all new Jupiter XR AFM systems and will be available as an upgrade for existing customers.
- “Asylum Research is committed to strengthen efficiency on the Jupiter AFM, so in addition to the Advanced Automation software package introduced a few months ago, we are now offering AR Maps to provide robust offline analysis capabilities.