Field electron emission

Varex to Showcase New X-Ray Components at RSNA 2020 Virtual Exhibition

Retrieved on: 
Monday, November 23, 2020
Technology, Health, Manufacturing, Radiology, Surgery, Oncology, Other Science, Other Technology, Medical devices, Software, Science, Other Manufacturing, Security, Cardiology, Vacuum tubes, Electrodes, Vacuum, Emitter, Field electron emission, Tomosynthesis, Cold cathode, RSNA, Nanotube, Electromagnetism, Articles, Physics

RSNA 2020 has transitioned to a virtual conference format and will take place November 29 - December 5, 2020.

Key Points: 
  • RSNA 2020 has transitioned to a virtual conference format and will take place November 29 - December 5, 2020.
  • To accommodate 2020s virtual RSNA Conference, Varex is launching a new virtual booth which will integrate 3D product models and videos highlighting our new products and innovative technologies for medical applications.
  • At RSNA 2020 Varex will be showcasing the NT2518C 25-emitter tube prototype available for use in Static Breast Tomosynthesis Systems as well as other emitter configurations for different industrial and medical applications.
  • (1)
    Nanotube technology replaces traditional coiled filament in a traditional X-ray tube with a multibeam field emission cold cathode nanotube emitter.

 JEOL: Release of the New Scanning Electron Microscope JSM-IT700HR

Retrieved on: 
Monday, August 3, 2020
Nanotechnology, Other Manufacturing, Hardware, Health, Medical devices, Technology, Semiconductor, Manufacturing, Physical sciences, Natural sciences, Scientific method, Electron microscopy, Accelerator physics, Electron beam, Microscopes, Scanning electron microscope, Microscopy, Electron microscope, MicroScope, Field electron emission

JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in August 2020.

Key Points: 
  • JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in August 2020.
  • (Photo: Business Wire)
    Scanning electron microscopes are used in various fields, such as nanotechnology, metals, semiconductors, ceramics, medicine, and biology.
  • Based on our award-winning predecessor of InTouchScope series SEMs, the JSM-IT700HR is equipped with our in-lens Schottky field emission electron gun (FEG).
  • The in-lens Schottky field emission electron gun allows for high-definition image observation and high spatial-resolution analysis.

JEOL: Release of a New Schottky Field Emission Scanning Electron Microscope JSM-IT800

Retrieved on: 
Monday, May 25, 2020
Science, Nanotechnology, Research, Other Manufacturing, Hardware, Technology, Semiconductor, Manufacturing, Physical sciences, Natural sciences, Physics, Electron microscopy, Microscopes, Scanning electron microscope, Microscopy, Electron microscope, Field electron emission, MicroScope, Electron, Scintillator

JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-IT800 in May 2020.

Key Points: 
  • JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-IT800 in May 2020.
  • View the full release here: https://www.businesswire.com/news/home/20200524005002/en/
    Scanning electron microscopes (SEMs) are used in various fields, such as nanotechnology, metals, semiconductors, ceramics, medicine, and biology.
  • A new Scintillator Backscattered Electron Detector (SBED) and a Versatile Backscattered Electron Detector (VBED) are also available with the JSM-IT800.
  • The Scintillator Backscattered Electron Detector (SBED, optional) has high responsiveness and is suitable to acquire material-contrast images at low accelerating voltage.

JEOL: Release of New Electron Probe Microanalyzers JXA-iHP200F and JXA-iSP100

Retrieved on: 
Thursday, November 14, 2019
Chemicals, Plastics, Other Energy, Automotive Manufacturing, Technology, Manufacturing, Energy, Hardware, Physical sciences, Microscopes, Radiation, Natural sciences, Analytical chemistry, Electron microprobe, Field electron emission, JEOL

JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the release of a new Schottky field emission Electron Probe Microanalyzer JXA-iHP200F and a new tungsten/LaB6 Electron Probe Microanalyzer JXA-iSP100, to be released in November 2019.

Key Points: 
  • JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the release of a new Schottky field emission Electron Probe Microanalyzer JXA-iHP200F and a new tungsten/LaB6 Electron Probe Microanalyzer JXA-iSP100, to be released in November 2019.
  • View the full release here: https://www.businesswire.com/news/home/20191113005986/en/
    Electron Probe Microanalyzers (EPMAs) are used as tools for research & development and quality control in a wide range of industrial fields, such as steels, automobiles, electronic parts, and battery materials.
  • Anyone can perform seamless operation from specimen insertion to determination of the area of analysis with high accuracy.
  • Since the maintenance is automatically carried out only when required, everyone can maintain the EPMA system in its optimal condition.

JEOL: Release of a New Schottky Field Emission(FE) Scanning Electron Microscope JSM-F100

Retrieved on: 
Sunday, August 4, 2019
Research, Hardware, Technology, Other Manufacturing, Science, Nanotechnology, Other Technology, Other Science, Manufacturing, Scientific method, Physical sciences, Laboratory techniques, Electron microscopy, Microscopy, Scanning electron microscope, Electron microscope, MicroScope, JEOL, Field electron emission, TESCAN

JEOL Ltd. (TOKYO:6951) ( www.jeol.com ) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-F100 in August 2019.

Key Points: 
  • JEOL Ltd. (TOKYO:6951) ( www.jeol.com ) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-F100 in August 2019.
  • View the full release here: https://www.businesswire.com/news/home/20190804005010/en/
    Scanning electron microscopes(SEMs) are used in various fields; nanotechnology, metals, semiconductors, ceramics, medicine, and biology.
  • With application expansion, SEM users are in need of fast high-quality data acquisition and simple compositional information confirmation with seamless operation.
  • The Hybrid Lens(HL), combining the electrostatic and magnetic field lens, supports high-spatial-resolution imaging and analysis of various specimens.