University of Delaware Advanced Materials Characterization Laboratory Acquires Two Rigaku X-ray Imaging Systems
Retrieved on:
Tuesday, April 9, 2019
NEWARK, Del., April 9, 2019 /PRNewswire-PRWeb/ --Rigaku Corporation is pleased to announce that the new University of Delaware CT Scanner Facility, based at the Patrick T. Harker Interdisciplinary Science and Engineering Laboratory's Advanced Materials Characterization Lab ( AMCL ), will host two advanced Rigaku X-ray computed tomography imaging systems.
Key Points:
- NEWARK, Del., April 9, 2019 /PRNewswire-PRWeb/ --Rigaku Corporation is pleased to announce that the new University of Delaware CT Scanner Facility, based at the Patrick T. Harker Interdisciplinary Science and Engineering Laboratory's Advanced Materials Characterization Lab ( AMCL ), will host two advanced Rigaku X-ray computed tomography imaging systems.
- The nano3dx and CT Lab GX 130 instruments from Rigaku address a wide range of applications in both materials and life sciences.
- In the case of a centralized facility such as the Advanced Materials Characterization Lab here at University of Delaware offering a wide range of analytical services to a broad user base, experimental flexibility and high throughput are especially critical."
- "The Advanced Materials Characterization Lab serves a diverse set of users across a wide range of disciplines from art conservation to engineering to physics and more," Poirier said.