Chigasaki, Japan, Oct 3, 2023 - (JCN Newswire) - ULVAC-PHI, Inc. has launched the sales of its flagship model of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) instrument, the 'PHI nanoTOF 3+.'
Key Points:
- Chigasaki, Japan, Oct 3, 2023 - (JCN Newswire) - ULVAC-PHI, Inc. has launched the sales of its flagship model of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) instrument, the 'PHI nanoTOF 3+.'
- This new product release comes two years after its predecessor, the PHI nanoTOF 3.
- The new model builds upon the foundation of the PHI nanoTOF 3 and introduces the following three new features.
- The new sample handling system in PHI nanoTOF 3+ achieves full compatibility with PHI XPS and AES instruments, enabling comprehensive analysis.
Polymer,
Semiconductor,
Metal,
Analytical chemistry,
Research,
University,
ESCA,
PHI,
Longevity,
GENESIS,
Robotics,
Photosynthesis,
Automation,
XPS,
Technology,
Ceramic,
Incorporated,
Quality control,
University of Kyiv Faculty of Radio Physics, Electronics and Computer Systems,
Mobile phone,
Medical imaging,
Video game console The PHI GENESIS is the united model of PHI's multi-functional scanning XPS instruments and was designed for automation and simplified operation.
Key Points:
- The PHI GENESIS is the united model of PHI's multi-functional scanning XPS instruments and was designed for automation and simplified operation.
- There is a growing need for high-performance and highly functional surface and interface analysis that can dramatically accelerate such research and development.
- The "PHI GENESIS" XPS provides high-speed, high-sensitivity, and overwhelming micro XPS analysis performance with automated multi-sample analysis with automatic sample exchange.
- ULVAC-PHI, Incorporated was founded in 1982 and provides advanced surface analysis instruments to universities and leading-edge industries worldwide for research and development.
