Advantest Developing Innovative Methodologies for High-Speed Scan and Software-Based Functional Testing
The new methodologies also will be used to perform system-level-type functional testing of the complex interactions among numerous cores within system-on-chip (SoC) devices, including the communication to an external host.
- The new methodologies also will be used to perform system-level-type functional testing of the complex interactions among numerous cores within system-on-chip (SoC) devices, including the communication to an external host.
- This will add to structural test coverage and facilitate the correlation between automated test equipment (ATE) and system-level testing (SLT).
- Together, these innovations will help bring software-based functional testing into the production environment, where potential defects can be identified earlier during wafer-sort and packaged-device testing.
- Synopsys, Inc. (Nasdaq: SNPS) is the Silicon to Software partner for innovative companies developing the electronic products and software applications we rely on every day.