NZO

NZO Cloud Offers HPC and AI Environments That Drive Innovation By Giving Users Cloud Control

Retrieved on: 
Tuesday, December 12, 2023

NZO Cloud ( www.nzocloud.com ) offers a unique approach focusing on giving control back to cloud users.

Key Points: 
  • NZO Cloud ( www.nzocloud.com ) offers a unique approach focusing on giving control back to cloud users.
  • Alex Lesser, Vice President of NZO Cloud, explains, "We are constantly having conversations with companies that feel helplessly trapped by their cloud providers,” begins Mr.
  • Lesser continues, “Our only objective is to ensure our cloud users success.” Based on their clients testimonials, NZO Cloud is meeting those objectives.
  • With a commitment to giving cloud users control and a focus on HPC and AI, NZO Cloud is poised to reshape the future of cloud computing.

Fractilia Adds Overlay Metrology Capability to Stochastics Control Solutions to Further Improve EUV Patterning Control and Yields

Retrieved on: 
Monday, June 12, 2023

AUSTIN, Texas, June 12, 2023 /PRNewswire/ --Fractilia, the leader in stochastics metrology and control solutions for advanced semiconductor manufacturing, today introduced the Fractilia Overlay Package, an optional offering that adds critical new overlay measurement and analysis capabilities to Fractilia's MetroLER™ and FAME™ products. Fractilia's products, which combine the company's patented Fractilia Inverse Linescan Model (FILM™) technology with true computational metrology, are the only proven fab solutions that provide highly accurate and precise measurements of all major stochastic effects – the single largest source of patterning errors at advanced nodes. Fractilia is currently engaged with multiple leading chip manufacturers in analyzing their SEM-based overlay data with the new Fractilia Overlay Package.

Key Points: 
  • Fractilia is currently engaged with multiple leading chip manufacturers in analyzing their SEM-based overlay data with the new Fractilia Overlay Package.
  • Optical-based metrology tools have traditionally been used by chip manufacturers to measure and control this pattern overlay, which is essential to producing high-yielding and high-performing semiconductor devices.
  • In addition, by combining SEM stochastics measurements with optical overlay measurements through our Fractilia Overlay Package, we believe that we not only can improve SEM overlay metrology accuracy, but also provide better lot dispositioning and correctables, which in turn can improve patterning control and reduce non-zero offset (NZO) or its variability."
  • With the new Fractilia Overlay Package, Fractilia adds highly accurate SEM-based overlay measurements, including their stochastic properties, on top of its existing measurement capabilities.

Proactive news headlines including Aldoro Resources, West Wits Mining, Suvo Strategic Minerals and Oar Resources

Retrieved on: 
Tuesday, January 17, 2023

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    West Wits Mining Ltd (ASX:WWI) has returned “significant” gold intersections in a maiden reverse circulation (RC) drill program at the Mt Cecelia Project in the Paterson Province of Western Australia.
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    Suvo Strategic Minerals Ltd (ASX:SUV) has wrapped up the purchase of Muchea Silica Sand Project in Western Australia after completion of the tenement purchase of exploration licence application E70/4981.
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    Oar Resources Ltd has submitted applications for five additional tenements surrounding its three already granted tenements at the Denchi Lithium Project near Wiluna in Western Australia’s Northern Goldfields.
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    New Century Resources Ltd (ASX:NCZ) has achieved two major operational milestones at its Century Mine and Karumba Port Facility in Queensland.