EBSD

VTT's multi-million investment in a plasma-FIB scanning electron microscope catapults Finland to the forefront of Nordic materials research

Retrieved on: 
Tuesday, March 26, 2024
Failure, TESCAN, Xe, Map, Research, EDS, Metal, 3D, Energy-dispersive X-ray spectroscopy, Wood, ICME, VTT, Ceramic, Paper, EBSD, Gallium, FIB, Microscope

ESPOO, Finland, March 26, 2024 /PRNewswire/ -- The first plasma-FIB scanning electron microscope in Finland has just become operational at VTT in Espoo, Finland.

Key Points: 
  • ESPOO, Finland, March 26, 2024 /PRNewswire/ -- The first plasma-FIB scanning electron microscope in Finland has just become operational at VTT in Espoo, Finland.
  • A TESCAN AMBER X system, Finland's first Focused Ion Beam (FIB) Scanning Electron Microscope (SEM) using Xenon plasma, has been taken into use at VTT Technical Research Centre of Finland.
  • Compared to traditional FIB-SEMs, it provides huge potential for excelling in materials research and multiplying the speed of materials development.
  • "The new capability for lightning-fast materials characterization in 3D supports, for example, integrated computational materials engineering (ICME) and materials acceleration platforms (MAPs).

Electron Microscope Market size to grow by USD 1.68 billion from 2022 to 2027; APAC to account for 55% of market growth- Technavio

Retrieved on: 
Tuesday, January 16, 2024
TESCAN, Semiconductor, JEOL, Research, EDS, ROW, Geography, Sony, Carl Zeiss AG, LG, Transmission electron microscopy, Nanotechnology, Thermo Fisher Scientific, TEM, Scanning electron microscope, Growth, Samsung, Carbon, Investment, Biology, FEI Company, Image, USD, HREM, Virus, Keysight, Protein, Free, EBSD, Cryogenic electron microscopy, Toshiba, Energy, Microscope

NEW YORK, Jan. 16, 2024 /PRNewswire/ -- The electron microscope market is expected to grow by USD 1.68 billion from 2022 to 2027.

Key Points: 
  • NEW YORK, Jan. 16, 2024 /PRNewswire/ -- The electron microscope market is expected to grow by USD 1.68 billion from 2022 to 2027.
  • The transmission electron microscope market size is estimated to grow by USD 458.93 million at a CAGR of 10.32% between 2022 and 2027.
  • The global scanning electron microscope (SEMs) market size is estimated to grow by USD 997.21 million at a CAGR of 8.01% between 2022 and 2027.
  • Growth of the electron microscope market across North America, Europe, Asia, and ROW
    Comprehensive analysis of factors that will challenge the growth of electron microscope market companies.

New Study Shows Deformation of First Formed Solids in Our Solar System Resulted from Nebular Shocks

Retrieved on: 
Tuesday, August 2, 2022
USRA, Association, Solar System, University, NASA, Universities Space Research Association, Arizona State University, Student, Geochimica et Cosmochimica Acta, Aluminium, Temperature, Calcium, Lunar, Research, Lunar and Planetary Institute, Institute, Government, National academy, NWA, University of Arizona, Radiometric dating, EBSD, CAI, National, LPI, Technology, Ametek, Science, Record, Engineering, Unitary state, Shock, Mineral, Renewable energy, Sulfur, Management

and HOUSTON, Aug. 2, 2022 /PRNewswire/ -- A recent study reports evidence of deformation in the oldest solids formed in our solar system resulting from nebular shocks.

Key Points: 
  • and HOUSTON, Aug. 2, 2022 /PRNewswire/ -- A recent study reports evidence of deformation in the oldest solids formed in our solar system resulting from nebular shocks.
  • A recent study of a CAI from NWA 5028 CR2 chondrite suggests that some CAIs may have experienced nebular shocks at early stages of the solar system history.
  • "These CAIs represent, to the best of our knowledge, the first solids that formed in the solar system.
  • However, shock deformation in CAIs implies that nebular shocks may have been more common in the early solar system than previously thought.

Covalent Metrology Expands its Electron Microscopy Capabilities

Retrieved on: 
Thursday, April 14, 2022
Covalent bond, Electron backscatter diffraction, S/TEM, Orientation, EBSD, Electronics, Chemistry, Energy-dispersive X-ray spectroscopy, 3D, Silicon, EDS, Microscope, Scio Diamond Technology Corporation

SUNNYVALE, Calif., April 14, 2022 /PRNewswire/ -- Covalent Metrology, a leading provider of analytical services in North America, announces the installation of two new Thermo Fisher Scientific Helios 5 UC DualBeam focused-ion-beam scanning electron microscopes (FIB-SEMs). Covalent now has four (4) Helios 5 microscopes, which is believed to be the most extensive fleet of new DualBeams among any service labs in North America.  The company's instrument acquisitions parallel growth in its electron microscopy teams: joined by four new technical staff in the last quarter. With expanded tool and team capacity, Covalent can meet the growing demand for electron microscopy services in the Silicon Valley area and beyond. Clients developing nanomaterials, semiconductor devices, electronics, and medical technologies will all benefit from faster access to nanoscale-resolution imaging.

Key Points: 
  • The Growing Electron Microscopy Group at Covalent's Silicon Valley lab significantly expands its team and instrument portfolio for FIB-SEM and S/TEM analysis.
  • The company's instrument acquisitions parallel growth in its electron microscopy teams: joined by four new technical staff in the last quarter.
  • With expanded tool and team capacity, Covalent can meet the growing demand for electron microscopy services in the Silicon Valley area and beyond.
  • Covalent has extended both its capacity and capabilities to deliver the latest, cutting-edge microscopy solutions to a growing market."

Hitachi: Two New FE-SEM Models Launched to Support Data-Driven R&D

Retrieved on: 
Thursday, December 9, 2021
Hitachi, Electronics, Materials science, Analytic, EBSD, Ceramic, Semiconductor, Technology, Schottky, Polymer, Data analysis, Efficiency, Metal, Comprehension, EDS, Rising Medical Solutions, FOV, Alliance for Telecommunications Industry Solutions, Time, Observation, Acquisition, Nanotechnology, Medical imaging, Microscope, Instrumentation

To be effective in such fields today, data-driven research and development requiring the acquisition of large data sets is necessary.

Key Points: 
  • To be effective in such fields today, data-driven research and development requiring the acquisition of large data sets is necessary.
  • Therefore, this product line has been designed to support the rapid acquisition of large, high-quality data sets and reduce the effort required by operators through the utilization of next-generation automation.
  • FE-SEMs in general are powerful instruments that provide not only high resolution images, but also a plethora of analytical, compositional, and morphological information.
  • These SEMs are used in a wide range of fields including nanotechnology, semiconductors, electronics, life sciences, materials science, and more.

JEOL: Release of Schottky Field Emission Scanning Electron Microscope JSM-IT800(i)/(is) Versions

Retrieved on: 
Tuesday, August 31, 2021
Semiconductor, Technology, Photography, Manufacturing, Software, Other Manufacturing, Hardware, UED, GUI, Observation, JEOL, UIT, Acquisition, JSM, SEMS, Nanotechnology, HL, Research, UID, Semiconductor, Biology, Multimedia, Metal, EDS, EBSD, Electron, SEM, Ceramic, Medicine, Microscope, Medical imaging

JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices of the Schottky Field Emission Electron Microscope JSM-IT800 (launched in May 2020), and began selling them in August 2021.

Key Points: 
  • JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices of the Schottky Field Emission Electron Microscope JSM-IT800 (launched in May 2020), and began selling them in August 2021.
  • View the full release here: https://www.businesswire.com/news/home/20210830005228/en/
    Scanning electron microscopes (SEMs) are used in a wide range of fields, such as nanotechnology, metals, semiconductors, ceramics, medicine, and biology.
  • Furthermore, the JSM-IT800 allows for the replacement of the objective lens of the SEM as a module, offering different versions to satisfy various users requirements.
  • A semi-in-lens achieves ultra high resolution by converging electron beams with the strong magnetic field lens formed below the objective lens.