KTE

Award winners announced for the 2nd Annual Impact Awards

Retrieved on: 
Monday, June 13, 2022
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TORONTO, June 13, 2022 (GLOBE NEWSWIRE) -- On June 7th, the 2nd Annual Impact Awards committee announced the winners for the 2021-2022 school year.

Key Points: 
  • TORONTO, June 13, 2022 (GLOBE NEWSWIRE) -- On June 7th, the 2nd Annual Impact Awards committee announced the winners for the 2021-2022 school year.
  • The awards celebrate teachers for their dedication and their use of research-backed teaching methods in the classroom.
  • 28 teachers won awards, and 9 received special recognition for their use of specific teaching methods in the classroom.
  • You can watch clips from the award show and the winners Impact Stories here:
    Media Contact for the Impact Awards:

Bell-Graham Boeckh Foundation Partnership announces $1.5 million in support of Foundry to transform youth mental health in BC and beyond

Retrieved on: 
Monday, January 24, 2022
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The gift is a part of the Bell-Graham Boeckh Foundation Partnership's $10M commitment to advance integrated systems of care for youth mental health across Canada through IYS.

Key Points: 
  • The gift is a part of the Bell-Graham Boeckh Foundation Partnership's $10M commitment to advance integrated systems of care for youth mental health across Canada through IYS.
  • Cumulatively, Bell and the Graham Boeckh Foundation have contributed more than $3M in philanthropic support to St. Paul's Foundation, helping to forge the Foundry provincial initiative.
  • "We are so grateful for the Bell-Graham Boeckh Foundation Partnership's lifetime support of Foundry.
  • "We're very proud to support Foundry as they continue their important work to transform youth mental health in BC.

Tektronix Introduces S530 Parametric Test System with KTE V7.1 Software to Speed Semiconductor Chip Production

Retrieved on: 
Thursday, September 16, 2021
Semiconductor, Silicon carbide, R, SRU, Efficiency, Blog, IOT, St. Michael's College School, CDS, Rectal prolapse, YouTube, View, Newsroom, LinkedIn, Election Systems & Software, Keithley, Environment, Calibration, Solution, Growth, Multimedia, Instagram, Twitter, SSO, Name, KTE, Bias, S530, Gallium nitride, Video game console, Transformer, Printed circuit board

BEAVERTON, Ore., Sept. 16,2021 /PRNewswire/ -- Tektronix, Inc. , a leading worldwide provider of test and measurement solutions, today released KTE V7.1 software for the Keithley S530 Series Parametric Test System to help accelerate semiconductor chip manufacturing just when the world market needs it most.

Key Points: 
  • BEAVERTON, Ore., Sept. 16,2021 /PRNewswire/ -- Tektronix, Inc. , a leading worldwide provider of test and measurement solutions, today released KTE V7.1 software for the Keithley S530 Series Parametric Test System to help accelerate semiconductor chip manufacturing just when the world market needs it most.
  • KTE V7.1 improves test times more than 10 percent versus KTE V5.8, which means engineers can reduce downtime and make chips faster.
  • Tektronix's release of this new testing system can help speed up manufacturing by decreasing test time and thus accelerating delivery of new chips to market.
  • The release of KTE V7.1 builds upon the improvements in functionality and throughput being made to the S530 system since the release of KTE 7.0.

Tektronix Introduces S530 Series Parametric Test System with KTE 7 Software to Support Wide Bandgap (WBG) Fabrication

Retrieved on: 
Tuesday, October 6, 2020
Semiconductor device fabrication, Tektronix, Wafer, KTE, Semiconductor fabrication plant, Electronics industry, Electronics manufacturing, Companies

BEAVERTON, Ore., Oct. 6, 2020 /PRNewswire/ -- Tektronix, Inc. , a leading worldwide provider of test and measurement solutions, today released the new Keithley S530 Series Parametric Test System with KTE 7 software and other enhancements.

Key Points: 
  • BEAVERTON, Ore., Oct. 6, 2020 /PRNewswire/ -- Tektronix, Inc. , a leading worldwide provider of test and measurement solutions, today released the new Keithley S530 Series Parametric Test System with KTE 7 software and other enhancements.
  • The S530 platform enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency.
  • To meet testing needs for these products, the KTE 7-based S530 platform boasts lab-grade measurement performance with minimal set-up and test time.
  • S530 Series Parametric Test System is now available worldwide, with pricing provided upon request.