Fractilia Dares Chipmakers to Take the Fractilia Challenge for Up to 20X Better Scanning Electron Microscope Matching and Higher Throughput at No Obligation
AUSTIN, Texas, Dec. 6, 2022 /PRNewswire/ -- Fractilia, the leader in stochastics metrology and control solutions for advanced semiconductor manufacturing, today announced that it has launched a new program that offers chipmakers the opportunity to achieve a 5-20x improvement in SEM tool-to-tool matching and up to 30 percent increased SEM tool throughput using the company's Fractilia Automated Measurement Environment (FAMEā¢) product at no obligation.
- Fractilia will then measure the SEM images using FAME and prepare a custom report detailing the SEM tool performance as well as potential tool matching and throughput improvements.
- With existing customers, the Fractilia Challenge has enabled a 5-20x improvement in tool-to-tool matching while simultaneously increasing SEM throughput by greater than 30 percent.
- Fractilia has a unique way to help them achieve better matching with results that they've never seen before.
- Fractilia is headquartered in Austin, Texas, and has numerous issued patents and hundreds of trade secrets covering its FILM and related technologies.