Electron backscatter diffraction

Covalent Metrology Expands its Electron Microscopy Capabilities

Retrieved on: 
Thursday, April 14, 2022
Covalent bond, Electron backscatter diffraction, S/TEM, Orientation, EBSD, Electronics, Chemistry, Energy-dispersive X-ray spectroscopy, 3D, Silicon, EDS, Microscope, Scio Diamond Technology Corporation

SUNNYVALE, Calif., April 14, 2022 /PRNewswire/ -- Covalent Metrology, a leading provider of analytical services in North America, announces the installation of two new Thermo Fisher Scientific Helios 5 UC DualBeam focused-ion-beam scanning electron microscopes (FIB-SEMs). Covalent now has four (4) Helios 5 microscopes, which is believed to be the most extensive fleet of new DualBeams among any service labs in North America.  The company's instrument acquisitions parallel growth in its electron microscopy teams: joined by four new technical staff in the last quarter. With expanded tool and team capacity, Covalent can meet the growing demand for electron microscopy services in the Silicon Valley area and beyond. Clients developing nanomaterials, semiconductor devices, electronics, and medical technologies will all benefit from faster access to nanoscale-resolution imaging.

Key Points: 
  • The Growing Electron Microscopy Group at Covalent's Silicon Valley lab significantly expands its team and instrument portfolio for FIB-SEM and S/TEM analysis.
  • The company's instrument acquisitions parallel growth in its electron microscopy teams: joined by four new technical staff in the last quarter.
  • With expanded tool and team capacity, Covalent can meet the growing demand for electron microscopy services in the Silicon Valley area and beyond.
  • Covalent has extended both its capacity and capabilities to deliver the latest, cutting-edge microscopy solutions to a growing market."

Global EDS, WDS, EBSD, Micro-XRF Instruments Market Analysis, Trends, and Forecasts 2019-2025 - ResearchAndMarkets.com

Retrieved on: 
Friday, December 27, 2019
Technology, Chemicals, Plastics, Electronic design automation, Manufacturing, Diffraction, Spectroscopy, Scientific method, Electron backscatter diffraction, Skills

The "EDS, WDS, EBSD, Micro-XRF Instruments - Market Analysis, Trends, and Forecasts" report has been added to ResearchAndMarkets.com's offering.

Key Points: 
  • The "EDS, WDS, EBSD, Micro-XRF Instruments - Market Analysis, Trends, and Forecasts" report has been added to ResearchAndMarkets.com's offering.
  • The EDS, WDS, EBSD, Micro-XRF Instruments market worldwide is projected to grow by US$226.2 Million, driven by a compounded growth of 5.6%.
  • Electron Backscatter Diffraction, one of the segments analyzed and sized in this study, displays the potential to grow at over 6.4%.
  • Poised to reach over US$109.5 Million by the year 2025, Electron Backscatter Diffraction will bring in healthy gains adding significant momentum to global growth.

Dragonfly 4.0 is Here! The Engine of Scientific Imaging

Retrieved on: 
Wednesday, April 24, 2019
Spectroscopy, Physical sciences, Optics, Natural sciences, Microscopy, Infrared imaging, Remote sensing, Imaging, Ptychography, Hyperspectral imaging, Electron backscatter diffraction, Dragonfly

MONTREAL, April 24, 2019 /PRNewswire/ --Dragonfly 4.0 is here!The engine of scientific imaging.

Key Points: 
  • MONTREAL, April 24, 2019 /PRNewswire/ --Dragonfly 4.0 is here!The engine of scientific imaging.
  • Based in Montreal, Canada, Object Research Systems (ORS) Inc., is excited to announce the release of Dragonfly 4.0, which brings major enhancements and improvements to image processing and analysis workflows.
  • In addition to deep learning advancements, this is the official release of Dragonfly on Linux platforms.
  • Finally, Dragonfly 4.0 presents new capabilities that facilitate the interactive visualization, manipulationand analysis of hyperspectral and hyperdimensional datasets from ptychography, EDS, EELS, SIMSand EBSD-imaging.

New Electron Backscatter Diffraction (EBSD) Detector Features Advanced Sensors and Optics

Retrieved on: 
Monday, August 6, 2018
Scientific method, Spectroscopy, Diffraction, Chemistry, Optics, Electron backscatter diffraction, Microscopes, Microscopy, Electron microscope

BALTIMORE, Aug. 6, 2018 /PRNewswire/ -- Microscopy and Microanalysis 2018 A new electron backscatter diffraction (EBSD) detector for electron microscopy is designed to help scientists, researchers and engineers quickly and accurately identify new materials and understand how the structure of a material affects its properties.

Key Points: 
  • BALTIMORE, Aug. 6, 2018 /PRNewswire/ -- Microscopy and Microanalysis 2018 A new electron backscatter diffraction (EBSD) detector for electron microscopy is designed to help scientists, researchers and engineers quickly and accurately identify new materials and understand how the structure of a material affects its properties.
  • The detector combines advanced optics with a new sensor that collects more than 2.2 megapixels, the largest number of pixels of any EBSD detector on the market.
  • The CMOS sensor provides exceptional sensitivity at high frame rates due to a high dynamic range, increased quantum efficiency and improved noise management.
  • The new detector is also designed to help microscopists better understand failure mechanisms.