MPI Corporation's Advanced Semiconductor Test Division Achieves Fully Traceable RF Calibration Breakthrough Up to 110 GHz
BRAUNSCHWEIG, Germany, Jan. 24, 2024 /PRNewswire/ -- MPI Corporation's Advanced Semiconductor Test (AST) Division, a pioneer in on-wafer testing solutions, today announced a landmark achievement in RF calibration technology.
- BRAUNSCHWEIG, Germany, Jan. 24, 2024 /PRNewswire/ -- MPI Corporation's Advanced Semiconductor Test (AST) Division, a pioneer in on-wafer testing solutions, today announced a landmark achievement in RF calibration technology.
- Collaborating with the Physikalisch-Technische Bundesanstalt (PTB) in Germany, the division has successfully achieved full traceability in characterizing a commercially-available calibration substrate up to 110 GHz and set a new industry benchmark.
- This achievement, spearheaded by Dr. Andrej Rumiantsev, Director of RF Technology at MPI-AST, represents a significant leap for the entire RF product line provided by MPI product line.
- The fully traceable characterization paves the way for more accurate, reliable, and universally accepted high-frequency measurements, essential for cutting-edge technologies like 5G.